Figure 55 :Fracture surface os Z samples at high magnification: aluminum grains smaller than 2 µm with silicon segregation at the grain boundaries.

Figure 55 :Fracture surface os Z samples at high magnification: aluminum grains smaller than 2 µm with silicon segregation at the grain boundaries.

Figure 55 :Fracture surface os Z samples at high magnification: aluminum grains smaller than 2
µm with silicon segregation at the grain boundaries.

Figure 55 :Fracture surface os Z samples at high magnification: aluminum grains smaller than 2
µm with silicon segregation at the grain boundaries.