Figure 6. Typical high contrast secondary electron SEM micrographs used to obtain average ESC and in-cavity solidified grain size (Table.1), for filling velocities of (i) 2.2 ms-1 , (ii) 3.6 ms-1 and (iii) 4.2 ms-1.

Published at 959 × 752 in Evolution of Dilatant Shear Bands in High Pressure Die Casting for Al-Si Alloy

Figure 6. Typical high contrast secondary electron SEM micrographs used to obtain average ESC and in-cavity solidified grain size (Table.1), for filling velocities of (i) 2.2 ms-1 , (ii) 3.6 ms-1 and (iii) 4.2 ms-1.

Figure 6. Typical high contrast secondary electron SEM micrographs used to obtain average ESC and
in-cavity solidified grain size (Table.1), for filling velocities of (i) 2.2 ms-1
, (ii) 3.6 ms-1 and (iii) 4.2 ms-1.

Figure 6. Typical high contrast secondary electron SEM micrographs used to obtain average ESC and
in-cavity solidified grain size (Table.1), for filling velocities of (i) 2.2 ms-1
, (ii) 3.6 ms-1 and (iii) 4.2 ms-1.